Sets out a wavelength dispersive X-ray fluorescence spectrometric method for the analysis of aluminium oxide for trace amounts of any or all of the following elements: sodium, silicon, iron, calcium, titanium, phosphorous, vanadium, zinc, manganese, gallium, potassium, copper, chromium and nickel, expressed as the oxides on an as-received basis.
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AS 4878.11-2001
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AS 4878.7-2001
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AS 4878.6-2001
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AS 4878.3-2001
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