Sets out a wavelength dispersive X-ray fluorescence procedure for the determination of zirconium, hafnium, silicon, aluminium, titanium, iron, phosphorus, calcium, lanthanum, cerium, thorium, uranium, arsenic and lead in zircon materials.
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AS 4292.5-1997
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AS 4292.3-1997
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AS 4433.2-1997
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AS 1670.2-1997
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